Summary

Highly Reliable Nonvolatile Semiconductor Memory for Long-term Cold Storage and Archive Applications

Ken TAKEUCHI 

Vol.98 No.12 pp.1051-1056

Publication Date:2015/12/01

Online ISSN:2188-2355

Print ISSN:0913-5693

Type of Manuscript:Special Section : Challenge for Long-term Storage Devices and Systems

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Online ISSN:2188-2355