Summary

半導体中の深い不純物準位の性質とその測定－2．深い不純物準位の動的パラメータの測定法－

生駒俊明 奥村次徳 

Vol.64 No.2 pp.195-202

Publication Date:1981/02/01

Online ISSN:2188-2355

Print ISSN:0913-5693

Type of Manuscript:Lecture Series

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Online ISSN:2188-2355