Variability of Characteristics in Scaled MOSFETs
Toshiro HIRAMOTO Kiyoshi TAKEUCHI Akio NISHIDA
Vol.92 No.6 pp.416-426
Publication Date:2009/06/01
Online ISSN:2188-2355
Print ISSN:0913-5693
Type of Manuscript:Special Section: LSI Design Techniques under Increase of Device Variations in CMOS Scaling
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