Summary

Variability of Characteristics in Scaled MOSFETs

Toshiro HIRAMOTO Kiyoshi TAKEUCHI Akio NISHIDA 

Vol.92 No.6 pp.416-426

Publication Date:2009/06/01

Online ISSN:2188-2355

Print ISSN:0913-5693

Type of Manuscript:Special Section: LSI Design Techniques under Increase of Device Variations in CMOS Scaling

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Online ISSN:2188-2355