High-speed Single-electron Transfer toward High-accuracy Current Standard:Transfer of Electrons One by One via a Charge Trap in Silicon Transistors
Vol.98 No.3 pp.246-248
Publication Date:2015/03/01
Online ISSN:2188-2355
Print ISSN:0913-5693
Type of Manuscript:News Commentary
Category:
Keyword:
---
Full Text:PDF(840.8KB)>>
Summary: