Summary

半導体中の深い不純物準位の性質とその測定－1．半導体中の深い不純物準位の電気的・光学的性質－

生駒俊明 奥村次徳 

Vol.64 No.1 pp.59-66

Publication Date:1981/01/01

Online ISSN:2188-2355

Print ISSN:0913-5693

Type of Manuscript:Lecture Series

Category:

Keyword:
---

Full Text:PDF(464.7KB)>>

Buy this Article

Summary:

Login

 > 

Forgotten your password?

menu

Online ISSN:2188-2355